6. Bibliography
1. I. L. Cherrick, “Rugged Electron Tubes,” Electronics, volume 21, pages 111-113 ; April, 1948.
2. E. B. Callick, “Notes on the Design and Manufacture of Reliable Valves,” February, 1.950; unpublished.
3. E. K. Morse, “Reliable Electron Tubes for Use in Airborne Electronic Equipment,” May, 1950 ; unpublished.
4. E. K. Morse, “Long-Life Tubes for Industry,” Electronics, volume 23, pages 68-69 ; September, 1950.
5. D. a Knowles, “Reliability in Electronics,” Westinghouse Engineer, volume 10, pages 242-244 ; November, 1950.
6. Papers presented at the Joint American Institute of Electrical Engineers—Institute of Radio Engineers Conference on Electron Tubes for Computers; December 11-13, 1950. Summaries of the papers appear in Electrical Engineering, volume 70, pages 163-165 ; February, 1951.
7. M. A. Acheson and M. McElwee, “Concerning the Reliability of Electron Tubes,” Sylvania Technologist, volume 4, pages 38-40 ; April, 1951.
8. G. H. Metson, Discussion on, “How Reliable is a Radio Valve,” Proceedings of the Institution of Electrical Engineers, Part 3, volume 98, pages 207-208 ; May, 1951.
9. J. R. Steen, “The JETEC Approach to the Tube-Reliability Problem,” Proceedings of the IRE, volume 39, pages 998-1000 ; September, 1951.
10. F. H. Cusack, “Vacuum-Tube Reliability,” Western Union Technical Review, volume 5, pages 154-159 ; October, 1951.
11. R. Bird, “Measurement of Microphony in Valves,” Electronic Engineering, volume 23, pages 429-431 ; November, 1951.
12. E. G. Rowe, “Technique of Trustworthy Valves,” Electrical Communication, volume 28, pages 257-275 ; December, 1951: also, Journal of the British Institution of Radio Engineers, volume 11, pages 525-543 ; November, 1951: also, Wireless World, volume 58, pages 105-108 ; March, 1952 : also, Proceedings of the IRE, volume 40, pages 1166-1177; October, 1952.
13. R. J. E. Whittier, “Mechanical Considerations Affecting Vacuum Tube Reliability,” Tele-Tech, volume 11, pages 42-44 and 62 ; and pages 54-56, 102, 104, and 106 ; February and March, 1952.
14. a O. Holland, I. E. Levy, and W. J. Davis,
“Loss of Thermionic Emission in Oxide-Coated-Cathode Tubes due to Mechanical Shock,” Proceedings of the IRE, volume 40, pages 587-590; May, 1952.
15. D. G. Koch, “Increasing Tube Reliability in Industrial Circuits,” Product Engineering, volume 23, pages 175-181 ; June, 1952.
16. H. A. Hammel, “Life Testing Reliable Tubes,” Electronics, volume 25 , pages 169, 172, and 17b; July, 1952.